LASERTEC CORPORATION

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
G01N INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 13193
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 7198
 
  
 
G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS594
 
  
 
G01J MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 474
 
  
 
G02F DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH IS MODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THE DEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY, COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g. SWITCHING, GATING, MODULATING OR DEMODULATING; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; FREQUENCY-CHANGING; NON-LINEAR OPTICS; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS 4129
 
  
 
G03F PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 4100
 
  
 
H04N PICTORIAL COMMUNICATION, e.g. TELEVISION 3239
 
  
 
G01R MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2157
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 2196
 
  
 
G06T IMAGE DATA PROCESSING OR GENERATION, IN GENERAL 2133

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9786057 Inspection apparatus, coordinate detection apparatus, coordinate detection method, and wavefront aberration correction methodAug 27, 15Oct 10, 17[H04N, G06T, G01N, G03F, G06K]
9719859 Interferometer and phase shift amount measuring apparatus with diffraction gratings to produce two diffraction beamsDec 10, 14Aug 01, 17[G01J, G01N, G01B, G03F]
9696568 Light source apparatus and inspection apparatusMay 12, 16Jul 04, 17[G01J, G01N, G02B, H01S, G02F]
9638729 Analysis apparatus and analysis methodNov 11, 13May 02, 17[H01M, G01R]
9638739 Defect coordinates measurement device, defect coordinates measurement method, mask manufacturing method, and reference maskMar 08, 13May 02, 17[G01R, G03F]
9588421 Pellicle inspection apparatusApr 10, 15Mar 07, 17[G03B, G03F]
9551672 Defect classifying method and optical inspection apparatus for silicon carbide substrateDec 18, 14Jan 24, 17[G01N]
9544558 Measuring apparatus and measuring methodDec 02, 14Jan 10, 17[H04N, G01J, G01M, G01B, G03F]
9240041 Defect inspection device, defect inspection method, and defect inspection programMay 28, 13Jan 19, 16[G06T, G06K]
9117869 Chucking device and chucking methodJan 06, 14Aug 25, 15[H01L, B25J]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2013/0234,597 PLASMA SHIELD DEVICE AND PLASMA SOURCE APPARATUSAbandonedMar 07, 13Sep 12, 13[H01J, H05H]
2011/0242,312 INSPECTION SYSTEM AND INSPECTION METHODAbandonedMar 28, 11Oct 06, 11[H04N, G06K]
2011/0134,944 EFFICIENT PULSE LASER LIGHT GENERATION AND DEVICES USING THE SAMEAbandonedDec 08, 09Jun 09, 11[H01S]
6858859 Optically scanning apparatus and defect inspection systemExpiredApr 22, 02Feb 22, 05[G01N]
6665326 Light source deviceExpiredOct 15, 01Dec 16, 03[H01S]
5900941 High speed pattern inspection method and systemExpiredMay 29, 97May 04, 99[G01B]

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